Determination of defect content and defect profile in semiconductor heterostructures
نویسندگان
چکیده
منابع مشابه
Growth, defect formation, and morphology control of germanium-silicon semiconductor nanowire heterostructures.
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ژورنال
عنوان ژورنال: Journal of Physics: Conference Series
سال: 2011
ISSN: 1742-6596
DOI: 10.1088/1742-6596/265/1/012004